| commit | a97ad691465db8d768623c63e597bedaedb25619 | [log] [tgz] |
|---|---|---|
| author | Roman Lebedev <lebedev.ri@gmail.com> | Fri Jul 13 16:14:37 2018 +0000 |
| committer | Roman Lebedev <lebedev.ri@gmail.com> | Fri Jul 13 16:14:37 2018 +0000 |
| tree | 7cbf794ca01e828df4064e8e8d602aac5c0a4dc5 | |
| parent | 57726810dce71720de5ab81393a6e977902fdaf2 [diff] |
[NFC][X86][AArch64] Negative tests for 'check for [no] signed truncation' pattern See D49247, D49266 I'm only adding the sane negative tests, and not adding the one-use tests yet. Also, not adding negative tests for the second pattern with inverted operands yet, since it's handling will be added in later differential. git-svn-id: https://llvm.org/svn/llvm-project/llvm/trunk@337014 91177308-0d34-0410-b5e6-96231b3b80d8