| commit | a26ddccfa2fdc673ab106306cdcdd2a0a8c2be95 | [log] [tgz] |
|---|---|---|
| author | Guy Blank <guy.blank@intel.com> | Tue May 09 14:03:51 2017 +0000 |
| committer | Guy Blank <guy.blank@intel.com> | Tue May 09 14:03:51 2017 +0000 |
| tree | 135e77e3a8c5beabdcb7f23cc1229e2dcfde1c59 | |
| parent | 1f4a80fdc1f6dcc8c46ecf7d2e0397cb6f673f33 [diff] |
[X86][AVX512] Refine some avx512er intrinsics tests. NFC. The modified tests should test the masked intrinsics. Currently the mask is constant, which with a future patch (https://reviews.llvm.org/D32805) will cause the intrinsics to be replaced with an unmasked version. This patch changes the constant mask to be a variable one. git-svn-id: https://llvm.org/svn/llvm-project/llvm/trunk@302529 91177308-0d34-0410-b5e6-96231b3b80d8