Managed profile creation/deletion stress test.
This test duplicates UserLifecycleStressTest to a degree, but it is
implemented as a host side test and is not subject to device test
timeout.
Bug: 141115315
Test: atest ManagedProfileLifecycleStressTest
Change-Id: I680a2f6965a49ba81b48591e4dcabc87091ac860
diff --git a/tests/ManagedProfileLifecycleStressTest/AndroidTest.xml b/tests/ManagedProfileLifecycleStressTest/AndroidTest.xml
new file mode 100644
index 0000000..e7dbc51
--- /dev/null
+++ b/tests/ManagedProfileLifecycleStressTest/AndroidTest.xml
@@ -0,0 +1,20 @@
+<?xml version="1.0" encoding="utf-8"?>
+<!-- Copyright (C) 2019 The Android Open Source Project
+
+ Licensed under the Apache License, Version 2.0 (the "License");
+ you may not use this file except in compliance with the License.
+ You may obtain a copy of the License at
+
+ http://www.apache.org/licenses/LICENSE-2.0
+
+ Unless required by applicable law or agreed to in writing, software
+ distributed under the License is distributed on an "AS IS" BASIS,
+ WITHOUT WARRANTIES OR CONDITIONS OF ANY KIND, either express or implied.
+ See the License for the specific language governing permissions and
+ limitations under the License.
+-->
+<configuration description="Stress test for managed profile lifecycle">
+ <test class="com.android.compatibility.common.tradefed.testtype.JarHostTest" >
+ <option name="jar" value="ManagedProfileLifecycleStressTest.jar" />
+ </test>
+</configuration>