This cl tries to fix cts tests IncidentdTest
1. Disable BatteryType section which is device-specific
2. Make timeout longer since meminfo section timedout in test
3. make some negative values sint
4. varint can be 64 bits, there is a bug implicitly convert it to 32
which loses values.
5. Found another bug which failed to read 64 bits varint, create a
native test to make sure it works.
Bug: 77291057
Test: atest CtsIncidentHostTestCases:com.android.server.cts.IncidentdTest
Change-Id: I04cc730741f7901f37ac57a11af7777d57118a23
diff --git a/libs/protoutil/src/EncodedBuffer.cpp b/libs/protoutil/src/EncodedBuffer.cpp
index 3a5e2e9..c017851 100644
--- a/libs/protoutil/src/EncodedBuffer.cpp
+++ b/libs/protoutil/src/EncodedBuffer.cpp
@@ -13,11 +13,13 @@
* See the License for the specific language governing permissions and
* limitations under the License.
*/
+#define LOG_TAG "libprotoutil"
+
+#include <stdlib.h>
#include <android/util/EncodedBuffer.h>
#include <android/util/protobuf.h>
-
-#include <stdlib.h>
+#include <cutils/log.h>
namespace android {
namespace util {
@@ -228,7 +230,7 @@
size_t start = mEp.pos();
while (true) {
uint8_t byte = readRawByte();
- val += (byte & 0x7F) << shift;
+ val |= (UINT64_C(0x7F) & byte) << shift;
if ((byte & 0x80) == 0) break;
shift += 7;
}
@@ -345,7 +347,7 @@
uint64_t val = 0, shift = 0;
while (true) {
uint8_t byte = next();
- val += (byte & 0x7F) << shift;
+ val |= (INT64_C(0x7F) & byte) << shift;
if ((byte & 0x80) == 0) break;
shift += 7;
}