| commit | d857cf147e21018690e12e7ae4f84c692a63b091 | [log] [tgz] |
|---|---|---|
| author | Etan Cohen <etancohen@google.com> | Tue Jan 31 12:30:16 2017 -0800 |
| committer | Etan Cohen <etancohen@google.com> | Tue Jan 31 12:32:39 2017 -0800 |
| tree | 47a228a4a44e50d89fe8f812828ea194347f902c | |
| parent | a93c6ba03f196e89117507646110a6fdd6ad59ba [diff] |
[HAL Device Manager] Minor clean-up of unit tests Remove duplicate in-order object initialization. Only use global in-order verifier. Bug: 34474043 Test: unit tests pass (before and after) Change-Id: If3fb10ad5ec8a59a5c8a7bf2139e686a0cced68e