| commit | d9784393daff5aec838c2b138f7116ce09728a93 | [log] [tgz] |
|---|---|---|
| author | Jack Yu <jackcwyu@google.com> | Fri Dec 11 16:01:45 2020 +0800 |
| committer | Jia Jia <jia.jia@zte.com.cn> | Thu Jan 28 02:13:31 2021 +0000 |
| tree | c47a9851c674dac7134c5dcaf3f794cfa5ef3a50 | |
| parent | b2bee2be31931197ad5e141cdac6edf14402e289 [diff] |
Extend test timeout value from 180s to 600s There are several test cases that may take longer duration to complete. Extend the timeout value to ensure there is sufficient running duration. Bug: 174717076 Test: atest VtsHalNfcV1_0TargetTest Change-Id: I4fc15184f0715131c45247820e1edbaae511b8a3 (cherry picked from commit f916560188148b852a9632a5c5bfe73314401ea3)