commit | 0a51242abcf658f84d62bb97ccdfb4f623c03326 | [log] [tgz] |
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author | Siarhei Vishniakou <svv@google.com> | Mon Mar 30 17:17:21 2020 -0700 |
committer | Siarhei Vishniakou <svv@google.com> | Tue Mar 31 06:18:34 2020 +0000 |
tree | 85d3b14476942ad3644a07fd312272abce978033 | |
parent | fa8e5f931a2ddf663a14d6caf1b2c16a40348c6b [diff] |
Convert InputClassifierTest to parametrized test The test is currently based on old vts harness and not in vts suite. Bug: 150383004 Test: atest VtsHalInputClassifierV1_0TargetTest Change-Id: I5df4eff845fd49b8663d1589c5314d5acf4b5057 Merged-In: I5df4eff845fd49b8663d1589c5314d5acf4b5057 (cherry picked from commit 25a866eecc75058be54a837fe5c00df496e626ca)