| commit | 84b91e04f862debb444be88572ca4dcb93b0bf43 | [log] [tgz] |
|---|---|---|
| author | Keun Soo Yim <yim@google.com> | Thu Nov 24 01:26:30 2016 +0000 |
| committer | Android (Google) Code Review <android-gerrit@google.com> | Thu Nov 24 01:26:31 2016 +0000 |
| tree | 46f25831dc0b6da9ccb0eaa3a8080c2a05ad3167 | |
| parent | 94a069e8dc2333f8447d553073afb21dcb6a6dd7 [diff] | |
| parent | 69431a4f683e8bd0b696979c27eee4fadc54fa9c [diff] |
Merge "increase the thermal hal timeout to 5m"
diff --git a/thermal/1.0/vts/functional/vts/testcases/hal/thermal/hidl/target/AndroidTest.xml b/thermal/1.0/vts/functional/vts/testcases/hal/thermal/hidl/target/AndroidTest.xml index cc159b9..169264d 100644 --- a/thermal/1.0/vts/functional/vts/testcases/hal/thermal/hidl/target/AndroidTest.xml +++ b/thermal/1.0/vts/functional/vts/testcases/hal/thermal/hidl/target/AndroidTest.xml
@@ -25,7 +25,7 @@ _64bit::DATA/nativetest64/thermal_hidl_hal_test/thermal_hidl_hal_test, "/> <option name="binary-test-type" value="gtest" /> - <option name="test-timeout" value="1m" /> + <option name="test-timeout" value="5m" /> </test> </configuration>
diff --git a/thermal/1.0/vts/functional/vts/testcases/hal/thermal/hidl/target_profiling/AndroidTest.xml b/thermal/1.0/vts/functional/vts/testcases/hal/thermal/hidl/target_profiling/AndroidTest.xml index 038dfe2..3790c56 100644 --- a/thermal/1.0/vts/functional/vts/testcases/hal/thermal/hidl/target_profiling/AndroidTest.xml +++ b/thermal/1.0/vts/functional/vts/testcases/hal/thermal/hidl/target_profiling/AndroidTest.xml
@@ -26,7 +26,7 @@ "/> <option name="test-config-path" value="vts/testcases/hal/thermal/hidl/target_profiling/ThermalHidlTargetProfilingTest.config" /> <option name="binary-test-type" value="gtest" /> - <option name="test-timeout" value="1m" /> + <option name="test-timeout" value="5m" /> </test> </configuration>