sdm: Add support for compliance test mode for DP
1. Add functionality in qdutils to get the DP test config from the
sysfs node.
2. Add support to generate ColorRamp, ColorSquare and Black and White
vertical line test pattern for 18/24/30 bpp DP display
3. Create layer stack with test layer and ignore all layers from
the SF framework.
4. Generate the pattern with 18/24/30 bpp based on pattern type
and bpp read from sysfs node and send it to DP interface.
5. Add support to calculate CRC to validate the color
pattern.
CRs-Fixed: 1107663
Change-Id: I49469d94a96ada729d24d7cc03a7e79f2af6edc0
7 files changed