tree 75e6ca0508ce214dcc53ee8133723c1c4fca77ab
parent b5de90c4609b591acd73656306cf864d6a23f1ec
author Jayden Kim <jaydenk@google.com> 1662443735 +0000
committer Jayden Kim <jaydenk@google.com> 1666549590 +0000

Adds LE Scan Downgrade API for concurrent operations

- Avoids maximum LE scan duty cycle during the concurrent operations
- Adds unit test cases to simulate the concurrent operations

Tag: #feature
Bug: 237351651
Test: atest BluetoothInstrumentationTests:ScanManagerTest
Test: manual test for BT connection with scanning
Change-Id: I34ef6faf83c59ecee547cfc0ceef71571b077c3c